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Rapid projection of crystal grain orientation distribution in aluminium alloy sheets by synchrotron X‐ray diffraction
Author(s) -
Kawasaki K.,
Koizumi M.,
Inagaki H.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597017573
Subject(s) - materials science , recrystallization (geology) , diffraction , aluminium , alloy , synchrotron , grain size , crystallography , aluminium alloy , grain growth , x ray crystallography , metallurgy , optics , geology , chemistry , physics , paleontology
An investigation of the primary recrystallization and the grain growth process of aluminium alloy sheets has been carried out using a method for rapid projection of the crystal grain orientation distribution. It is found that the projected pattern is continuous in the cold‐rolled state. When the sheet is annealed, tiny diffraction spots or small grains appear. The addition of Mg greatly alters the sizes and number of grains, and the orientation of the grains in sheets.

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