Open AccessAbsolute soft X‐ray measurements using an ion chamber
Author(s) -
Saito Norio,
Suzuki Isao H.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597017548
Subject(s) - ion , x ray , soft x rays , materials science , physics , optics , laser , quantum mechanics
Measurements of soft X‐ray absolute intensities have been carried out using a double ion chamber and monochromated synchrotron radiation. The chamber is cylindrical and 1.3 m long. The soft X‐ray beam enters the chamber at a position off the central axis, and the produced ions are collected with electrodes on the opposite side to the photon entrance. An index constant for rare gas, the γ‐value, which is the average number of electrons emitted from an atom having absorbed a photon, was used for obtaining the absolute photon intensity. The obtained intensity ranges from 1 Gphotons s −1 to 25 Gphotons s −1 in the energy range 72–800 eV. The estimated uncertainty is about 5–20% depending on the intensity and the spectral purity of the soft X‐rays.