
Focusing monochromator and imaging‐plate camera for grazing‐incidence diffraction studies of thin films
Author(s) -
Foran Garry J.,
Garrett Richard F.,
Gentle Ian R.,
Creagh Dudley C.,
Peng Jian Bang,
Barnes Geoffrey T.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597017287
Subject(s) - monochromator , optics , beamline , wafer , diffraction , materials science , diffractometer , crystal (programming language) , beam (structure) , physics , optoelectronics , computer science , scanning electron microscope , wavelength , programming language
A multiple‐imaging‐plate detector system and focusing monochromator have been developed and successfully applied to the time‐resolved study of phase transitions in Langmuir–Blodgett films by grazing‐incidence X‐ray diffraction (GIXD). The monochromator described here combines fixed‐exit‐beam height with sagittal focusing of the second crystal. The design is similar to that of Matsushita et al. [Matsushita, Ishikawa & Oyanagi (1986). Nucl. Instrum. Methods , A 246 , 377–379], with the exception that the motion of the first crystal is achieved via a computer‐controlled X‐Y translation table rather than a set of cams. The second crystal is a ribbed Si(111) wafer mounted in a four‐point bending mechanism. The first reported application of imaging plates to a GIXD study was carried out by our group and proved to be very successful in the determination of thin‐film structure [Foran, Peng, Steitz, Barnes & Gentle (1996). Langmuir , 12 , 774–777]. To extend the capabilities of this system, an imaging‐plate camera was designed and built which can accommodate up to 13 imaging plates (40 × 20 cm) inside the vacuum chamber of the main diffractometer at the Australian Beamline at the Photon Factory.