Open AccessAbsolute calibration of a soft X‐ray spectrograph for X‐ray laser research using white beam
Author(s) -
Fujikawa C.,
Kawachi T.,
Ando K.,
Yamaguchi N.,
Hara T.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597016117
Subject(s) - spectrograph , optics , physics , calibration , laser , synchrotron radiation , wavelength , x ray , synchrotron , beam (structure) , absorption (acoustics) , spectral line , astronomy , quantum mechanics
Absolute calibration of a soft X‐ray spectrograph has been performed using a white beam of synchrotron radiation. The calibrated spectrograph was a flat‐field grazing‐incidence spectrograph with an X‐ray CCD detector for X‐ray laser research. Absolute sensitivity of the spectrograph system can be obtained from transmitted spectra using filters made of several different materials, each providing an absorption‐edge wavelength standard. The absolute sensitivity determined in this work shows nearly the same behaviour with wavelength as that in another calibration experiment using a laser‐produced plasma as an X‐ray source.