Open AccessX‐ray magnetic reflectometry using circularly polarized radiation
Author(s) -
Neumann Claus,
Rogalev Andrei,
Goulon José,
Lingham Mik,
Ziegler Eric
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597016099
Subject(s) - reflectometry , monochromator , undulator , optics , radiation , synchrotron radiation , polarization (electrochemistry) , circular polarization , dispersion (optics) , materials science , physics , chemistry , wavelength , microstrip , time domain , computer science , computer vision
Magnetic reflectometry experiments have been performed in the X‐ray range at the L 2,3 edges of rhodium. What makes these experiments original is the insertion of a very compact double‐bounce reflectometer upstream of the monochromator. This configuration makes full use of the high polarization rate of the helical undulator source. This advantage is reflected in the high quality of the data obtained after only a few accumulations. It is also shown that, by properly selecting the angle of incidence, one may obtain experimental differential X‐ray reflectivity spectra dominated either by the dispersion or the absorption terms.