Open AccessThe LNLS soft X‐ray spectroscopy beamline
Author(s) -
Tolentino H.,
CompagCailhol V.,
Vicentin F. C.,
Abbate M.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597016087
Subject(s) - beamline , monochromator , optics , wiggler , physics , magnetic circular dichroism , spectroscopy , materials science , electron , beam (structure) , nuclear physics , cathode ray , wavelength , quantum mechanics , astronomy , spectral line
The soft X‐ray spectroscopy beamline installed at a bending‐magnet source at the LNLS is described. The optics are designed to cover energies from 800 to 4000 eV with good efficiency. The focusing element is a gold‐coated toroidal mirror with an angle of incidence of 17 mrad. The UHV double‐crystal monochromator has three pairs of crystals, Si (111), InSb (111) and beryl (101¯0), that can be selected by a sliding movement. The UHV workstation is equipped with an ion gun, an electron gun, an electron analyser, LEED optics, an open channeltron and a photodiode array. This beamline is intended for photoemission, photoabsorption, reflectivity and dichroism experiments.