Open AccessAn additional axis for the surface X‐ray diffractometer
Author(s) -
Takahasi Masamitu,
Mizuki Jun'ichiro
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597016014
Subject(s) - diffractometer , optics , perpendicular , detector , rotation (mathematics) , surface (topology) , physics , plane (geometry) , slit , x ray , geometry , mathematics , scanning electron microscope
A new surface X‐ray diffractometer based on a κ‐type diffractometer will be installed in BL14B1, SPring‐8. This diffractometer has an additional axis on its detector arm for rotating the receiving slit about the normal of the slit plane, in addition to two axes for positioning the detector. This additional axis is founded on the consideration of the correction factor which has been derived so as to be valid for the z ‐axis mode measurement using any incoming and outgoing angles of the X‐ray beam. The rotational slit allows accurate measurement of the surface structure factor up to large perpendicular momentum transfer.