Open AccessSurface X‐ray scattering system at the SRRC
Author(s) -
Hsu ChiaHung,
Tang MauTsu
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s090904959701385x
Subject(s) - scattering , x ray , beamline , surface (topology) , materials science , phase (matter) , optics , chemistry , physics , beam (structure) , geometry , mathematics , organic chemistry
A UHV surface X‐ray scattering system has been constructed at the SRRC, providing users with a state‐of‐the‐art system for performing X‐ray scattering studies of two‐dimensional crystallography, in situ growth mechanisms as well as phase transitions of surfaces and interfaces. A study of the phase transition of the Si(001) reconstructed surface was conducted to commission both the scattering system and the SRRC X‐ray beamline. The detailed design and performance of the SRRC surface X‐ray scattering system together with the results of the Si(001) study are presented.