
Statistical Analysis of X‐ray Speckle at the NSLS
Author(s) -
Tsui O. K. C.,
Mochrie S. G. J.,
Berman L. E.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s090904959701039x
Subject(s) - wiggler , beamline , speckle pattern , coherence (philosophical gambling strategy) , physics , optics , statistical analysis , synchrotron , photon , synchrotron radiation , advanced photon source , beam (structure) , nuclear physics , statistics , mathematics , cathode ray , quantum mechanics , electron
A statistical analysis of the static speckle produced by illuminating a disordered aerogel sample by a nominally coherent X-ray beam at wiggler beamline X25 at the National Synchrotron Light Source is reported. The results of the analysis show that the coherence delivered to the X25 hutch is within 35% of what is expected. The rate of coherent photons is approximately two times smaller than expected on the basis of the X25 wiggler source brilliance.