Open AccessOperation of a Two‐Crystal X‐ray Interferometer at the Photon Factory
Author(s) -
Momose A.,
Yoneyama A.,
Hirano K.
Publication year - 1997
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597007097
Subject(s) - interferometry , synchrotron radiation , interference (communication) , optics , crystal (programming language) , physics , visibility , x ray , photon , phase (matter) , astronomical interferometer , phase contrast imaging , synchrotron , diffraction , materials science , interferometric visibility , phase contrast microscopy , computer science , computer network , channel (broadcasting) , quantum mechanics , programming language
A two‐crystal X‐ray interferometer for phase‐contrast X‐ray imaging is reported. Mechanical stability of less than 0.1 nm is required to operate the two‐crystal interferometer. The feasibility of using such an interferometer at the Photon Factory using synchrotron radiation has been investigated. Interference fringes of 70% visibility were observed with 0.092 nm X‐rays. This result indicates that the two‐crystal X‐ray interferometer can be applied to phase‐contrast X‐ray imaging.