
Investigation of the Variation in Orientation and Crystallinity in Poly(ethylene terephthalate) Containers Using Microfocus X‐ray Diffraction
Author(s) -
Martin C.,
Mahendrasingam A.,
Fuller W.,
Harvie J. L.,
Blundell D. J.,
Whitehead J.,
Oldman R. J.,
Riekel C.,
Engström P.
Publication year - 1997
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597004512
Subject(s) - crystallinity , beamline , synchrotron radiation , materials science , x ray , diffraction , optics , poly ethylene , scattering , orientation (vector space) , ethylene , resolution (logic) , synchrotron , beam (structure) , x ray crystallography , crystallography , composite material , physics , chemistry , geometry , artificial intelligence , computer science , catalysis , biochemistry , mathematics
The microfocus X‐ray beamline at the European Synchrotron Radiation Facility has been used to investigate the variation in molecular orientation and crystallinity in the wall of a container fabricated from poly(ethylene terephthalate). Two‐dimensional wide‐angle X‐ray scattering patterns were recorded and displayed in real time as the specimen was tracked across the incident X‐ray beam enabling the measurement of textural changes to be made with a spatial resolution of ~2 μm.