Open AccessX‐ray Reflectivity at the L Edges of Gd
Author(s) -
Ishimatsu N.,
Venkataraman C. T.,
Hashizume H.,
Hosoito N.,
Namikawa K.,
Iwazumi T.
Publication year - 1997
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597001441
Subject(s) - specular reflection , scattering , surface finish , asymmetry , optics , reflectivity , surface roughness , anomalous scattering , thin film , materials science , absorption (acoustics) , physics , condensed matter physics , photon , molecular physics , computational physics , atomic physics , nanotechnology , quantum mechanics , composite material
Preparations are underway for the experimental investigation of the roughness of magnetic interfaces in rare‐earth multilayers by combining the grazing‐angle X‐ray scattering technique with the resonant magnetic scattering of hard X‐rays. Theoretical considerations show that for small scattering angles, 2 θ , the asymmetry ratio, A = [ I (+) − I (−)]/[ I (+) + I (−)], depends on 2 θ and varies as 1/cos θ . The first step towards the goal of determining the magnetic roughness has been taken by measuring the chemical roughness ( via specular reflectivity) of a Gd thin‐film sample at five photon energies close to the L 3 absorption edge, which yielded the dispersion corrections, f ′ and f ′′, to the Gd atomic form factor in good agreement with the calculation of Cromer & Liberman [ J. Chem. Phys . (1970), 53 , 1891–1898].