Open AccessLaue Orientation Imaging
Author(s) -
Wenk H. R.,
Heidelbach F.,
Chateigner D.,
Zontone F.
Publication year - 1997
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s090904959601432x
Subject(s) - orientation (vector space) , optics , texture (cosmology) , orthorhombic crystal system , projection (relational algebra) , hough transform , physics , materials science , geometry , diffraction , artificial intelligence , computer science , image (mathematics) , mathematics , algorithm
Advantage was taken of the highly focused X‐ray beam (10–30 μm) and the broad white spectrum of synchrotron X‐rays at the ESRF for automatic recording of Laue patterns from polycrystals and extraction of orientation information. The procedure used is similar to that applied for electron‐backscattering patterns in the scanning electron microscope and provides data for local orientation mapping used in texture analysis. Laue patterns are obtained from a thin slice of material in transmission and recorded with a CCD detector. The Laue geometry is converted into a gnomonic projection in which co‐zonal reflections lie on straight lines. On applying the Hough transform these lines are merged into a single point, which is recognized by the computer and assigned zone indices [ uvw ] by comparison with a table of interzonal angles. From the angular positions of several [ uvw ] the crystal orientation is calculated. The method is illustrated for the orthorhombic magnesium silicate olivine.