Open AccessIn Situ Single‐Crystal X‐ray Diffraction Study of Crystallization Kinetics in Clathrasil Dodecasil‐3C
Author(s) -
Morris R. E.,
Weigel S. J.,
Norby P.,
Hanson J. C.,
Cheetham A. K.
Publication year - 1996
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049596010965
Subject(s) - crystallization , synchrotron radiation , diffraction , kinetics , materials science , in situ , synchrotron , crystallography , x ray crystallography , crystal (programming language) , optics , x ray , physics , chemistry , thermodynamics , computer science , quantum mechanics , meteorology , programming language
The formation of single crystals of the clathrasil dodecasil‐3C from a solvothermal synthesis has been followed by in situ diffraction techniques using synchrotron radiation and an image‐plate area detector. The high intensity of the X‐ray beam, coupled with the ability to record time‐resolved two‐dimensional data using the image plates, allowed the crystallization kinetics to be studied and rate expressions to be fitted to the crystallization curves.