Open AccessSoft X‐ray Emission Spectroscopy at ESRF Beamline 26 Based on a Helical Undulator
Author(s) -
Dallera C.,
Puppin E.,
Trezzi G.,
Incorvaia N.,
Fasana A.,
Braicovich L.,
Brookes N. B.,
Goedkoop J. B.
Publication year - 1996
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049596006061
Subject(s) - beamline , undulator , spectrograph , synchrotron radiation , spectroscopy , physics , optics , emission spectrum , x ray , radiation , astronomy , spectral line , beam (structure)
A new soft X‐ray spectrograph for X‐ray emission spectroscopy excited by synchrotron radiation is presented. The apparatus is now installed on beamline 26 at the ESRF in Grenoble. A brief description of the beamline is given and then several components of the spectrograph are covered in more detail. Results of experiments performed both with direct non‐monochromated undulator radiation and with monochromated radiation are reported.