Open AccessApplication of a CdTe Solid‐State Detector to Polarization‐Dependent Total‐Reflection Fluorescence XAFS Measurements
Author(s) -
Chun W.J.,
Asakura K.,
Iwasawa Y.
Publication year - 1996
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049596005250
Subject(s) - x ray absorption fine structure , detector , materials science , fluorescence , polarization (electrochemistry) , cadmium telluride photovoltaics , analytical chemistry (journal) , spectral line , optics , chemistry , optoelectronics , physics , spectroscopy , chromatography , quantum mechanics , astronomy
A CdTe solid‐state detector was applied to the measurement of polarization‐dependent total‐reflection fluorescence XAFS spectra. The data revealed that the detector has good sensitivity, and this, together with its compact size, make it appropriate for in‐situ measurements and removal of X‐ray Bragg diffraction. The detector efficiently recorded the high‐energy K ‐edge XAFS spectra for molybdenum oxides supported on TiO 2 (110).