Open AccessApplications of Synchrotron Radiation to Defect Characterization and Pendellösung Fringe‐Spacing Measurement in a Natural Diamond
Author(s) -
Lang A. R.,
Pang G.,
Makepeace A. P. W.
Publication year - 1996
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049596004268
Subject(s) - synchrotron radiation , optics , synchrotron , diamond , refraction , x ray optics , birefringence , materials science , crystal (programming language) , physics , x ray , computer science , composite material , programming language
A small polished rectangular block of natural diamond unusually free from impurity zoning was examined by birefringence and synchrotron X‐ray topography to map internal defects and assess effects of some accidental mechanical damage. `Orthogonal‐view' projection topographs facilitated comparisons between optical and X‐ray images. Speedy and precise positioning of crystal sections cut in synchrotron X‐ray section topographic studies was aided by radiographic and fluoroscopic procedures, which are described. Several X‐ray reflection and refraction phenomena are illustrated, including high‐contrast refraction images of crystal edges, chipping and crack outcrops. It was demonstrated that by combining optical and X‐ray goniometry it was possible to record Pendellösung fringe systems employing precisely selected X‐ray wavelengths in well defined crystal volumes. Valuable gain in fringe visibility resulted from the use of pure σ ‐mode polarized synchrotron radiation. Absolute values of the diamond 004 structure factor were derived from five fringe systems measured, the findings (in upward order) being 11.7, 11.7, 12.0, 12.5, 12.6. Their scatter greatly exceeds the uncertainty in the measurement procedure (believed to be within ±1%) and is attributed to different strain distributions within the five volumes sampled.