Open AccessLow‐Angle Synchrotron Radiation Diffraction with Glass‐Capillary Optics
Author(s) -
Engström P.,
Riekel C.
Publication year - 1996
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049596001355
Subject(s) - borosilicate glass , optics , synchrotron radiation , undulator , materials science , wavelength , diffraction , total external reflection , scattering , radiation , beam (structure) , synchrotron , optical glass , crystallite , total internal reflection , optoelectronics , physics , composite material , metallurgy
The use of borosilicate‐glass‐capillary optics at a chosen wavelength for low scattering has been explored using an undulator beam at the ESRF. With a 2.3 μm beam at 0.092 nm wavelength, a silver behenate powder sample was scanned in two dimensions with a 2 μm step width. Scattering from single crystallites with d 001 = 5.83 nm could be observed. The limit for observation, at low angles, was ca s ≃ 0.1 nm −1 ( s = 1/ d for d ≃ 10 nm).