Open AccessA Novel X‐ray Diffractometer to Study the Texture of Materials
Author(s) -
Tang C. C.,
Miller M. C.,
Clark S. M.,
Player M. A.,
Craib G. R. G.
Publication year - 1996
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s090904959501404x
Subject(s) - diffractometer , texture (cosmology) , diffraction , materials science , synchrotron radiation , optics , x ray crystallography , deformation (meteorology) , x ray , synchrotron , erbium , composite material , optoelectronics , physics , computer science , doping , scanning electron microscope , image (mathematics) , artificial intelligence
An X‐ray energy‐dispersive diffraction technique to study the texture of materials using synchrotron radiation has been developed. The design and commissioning of the diffraction instrument are described. The technique was first applied to study a drawn‐wire aluminum sample which has a well known deformation texture. To demonstrate its capability further, results obtained from an erbium evaporated thin film are also presented.