Open AccessFocusing of X‐rays by Total External Reflection from a Paraboloidally Tapered Glass Capillary
Author(s) -
Balaic D. X.,
Nugent K. A.,
Barnea Z.,
Garrett R.,
Wilkins S. W.
Publication year - 1995
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049595010831
Subject(s) - pinhole (optics) , total external reflection , optics , reflection (computer programming) , total internal reflection , capillary action , x ray optics , x ray , focus (optics) , materials science , physics , transmission (telecommunications) , composite material , computer science , programming language , telecommunications
The first observation of a true geometrical focus of X‐rays well beyond the exit of a paraboloidally tapered glass monocapillary is reported. An intensity gain of 250 ± 20 into a 6 × 9 μm pinhole for 8 keV X‐rays and transmission efficiencies of more than 90% below 20 keV were observed.