Focusing of X‐rays by Total External Reflection from a Paraboloidally Tapered Glass Capillary | Zendy

Balaic D. X. | Zendy; Nugent K. A. | Zendy; Barnea Z. | Zendy; Garrett R. | Zendy; Wilkins S. W. | Zendy

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Focusing of X‐rays by Total External Reflection from a Paraboloidally Tapered Glass Capillary

Author(s) -

Balaic D. X.,

Nugent K. A.,

Barnea Z.,

Garrett R.,

Wilkins S. W.

Publication year - 1995

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049595010831

Subject(s) - pinhole (optics) , total external reflection , optics , reflection (computer programming) , total internal reflection , capillary action , x ray optics , x ray , focus (optics) , materials science , physics , transmission (telecommunications) , composite material , computer science , programming language , telecommunications

The first observation of a true geometrical focus of X‐rays well beyond the exit of a paraboloidally tapered glass monocapillary is reported. An intensity gain of 250 ± 20 into a 6 × 9 μm pinhole for 8 keV X‐rays and transmission efficiencies of more than 90% below 20 keV were observed.

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