Open AccessEvaluation of Charge‐Injection Devices for Use in Laue Diffraction Imaging
Author(s) -
Hanley Q. S.,
True J. B.,
Denton M. B.
Publication year - 1995
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049595007849
Subject(s) - diffraction , detector , optics , photon , photon counting , physics , pixel , dynamic range , optoelectronics , energy (signal processing) , reflection (computer programming) , photon energy , materials science , range (aeronautics) , computer science , quantum mechanics , composite material , programming language
Charge‐injection devices (CIDs) are versatile detectors having a number of features which recommend them for use in the imaging of X‐ray diffraction patterns. They have a flexible nondestructive readout allowing for analysis of image quality during data collection and rapid readout of selected portions of the device. CIDs have full‐well capacities in the range of 10 6 charge carriers giving them a high dynamic range for both direct and indirect imaging of X‐rays. CIDs have peak quantum efficiencies in the optical region over 50% allowing for their incorporation into indirect detection systems. Rapid random single‐pixel address allows for their use as single X‐ray photon counters with energy discrimination. Three types of position‐sensitive detectors for X‐rays have been developed using CIDs. Two CID formats, the CID 17PPRA (388 × 256) and the CID 38SG (512 × 512), were incorporated into systems performing indirect imaging, direct imaging and single X‐ray photon counting with energy discrimination. Indirect images of the Laue diffraction patterns from tetraphenylphosphonium tetrachlorooxomolybdenum(V) and natural MoS 2 were collected using a phosphor sheet to convert X‐rays into optical photons which were detected with the CID 38SG. Directly detected images of spots from the Laue diffraction pattern of MoS 2 were recorded with the CID 17PPRA. Single photon counting with energy discrimination is demonstrated with the CID 17PPRA using a reflection from the Laue diffraction pattern of MoS 2 . Useful information could be obtained from a single pixel at read rates over 7 kHz. Complete energy‐dispersive analysis suitable for determination of space groups from Laue diffraction is currently limited due to incomplete charge collection and/or split events.