Open AccessRapid Mapping of Texture in Polycrystalline Materials Using an Imaging Plate on a Synchrotron Radiation Source
Author(s) -
Kawasaki K.,
Iwasaki H.
Publication year - 1995
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049594011374
Subject(s) - synchrotron radiation , texture (cosmology) , crystallite , materials science , synchrotron , radiation , optics , zone plate , physics , computer science , metallurgy , diffraction , image (mathematics) , computer vision
Taking advantage of the high brilliance of synchrotron radiation, a system was developed for rapid mapping of the orientation distribution of crystal grains (texture) in polycrystalline materials using an imaging plate. A monochromatized beam is incident on the sample, which is rotated using the ω ‐axis mechanism of an X‐ray diffractometer so that the surface of the sphere of poles of the selected reflection is scanned by the Ewald sphere. Simultaneously, the imaging plate is translated vertically with a velocity that is synchronized with that of the sample rotation. It is possible to record pole figures over an extended angular range within a short period of time, typically of the order of minutes. The method has been applied to the observation of a time change in the orientation distribution of metal sheets at elevated temperatures.