Open AccessCapability of insulator study by photoemission electron microscopy at SPring‐8
Author(s) -
Ohkochi Takuo,
Kotsugi Masato,
Yamada Keisuke,
Kawano Kenji,
Horiba Koji,
Kitajima Fumio,
Oura Masaki,
Shiraki Susumu,
Hitosugi Taro,
Oshima Masaharu,
Ono Teruo,
Kinoshita Toyohiko,
Muro Takayuki,
Watanabe Yoshio
Publication year - 2013
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049513012508
Subject(s) - spring (device) , spring 8 , photoemission electron microscopy , electron , electron microscope , insulator (electricity) , materials science , angle resolved photoemission spectroscopy , nanotechnology , physics , engineering physics , atomic physics , condensed matter physics , nuclear physics , electronic structure , optoelectronics , optics , beam (structure) , beamline , thermodynamics
The observation method of photoemission electron microscopy (PEEM) on insulating samples has been established in an extremely simple way. Surface conductivity is induced locally on an insulating surface by continuous radiation of soft X‐rays, and Au films close to the area of interest allow the accumulated charges on the insulated area to be released to ground level. Magnetic domain observations of a NiZn ferrite, local X‐ray absorption spectroscopy of sapphire, high‐resolution imaging of a poorly conducting Li 0.9 CoO 2 film surface, and Au pattern evaporation on a fine rock particle are demonstrated. Using this technique, all users' experiments on poorly conducting samples have been performed successfully at the PEEM experimental station of SPring‐8.