Open AccessAccuracy evaluation in temperature‐dependent EXAFS measurements of CdTe
Author(s) -
Abd el All N.,
Thiodjio Sendja B.,
Grisenti R.,
Rocca F.,
Diop D.,
Mathon O.,
Pascarelli S.,
Fornasini P.
Publication year - 2013
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049513012053
Subject(s) - extended x ray absorption fine structure , cadmium telluride photovoltaics , materials science , chemistry , environmental science , optoelectronics , physics , optics , absorption spectroscopy
The evaluation of uncertainty in temperature‐dependent EXAFS measurements is discussed, considering the specific case of a recent experiment performed on CdTe. EXAFS at both Cd and Te K ‐edges was measured at different times and at different beamlines in a temperature range from 5 to 300 K. Attention is focused on the nearest‐neighbours parameters: bond thermal expansion, parallel and perpendicular mean‐square relative displacements and the third cumulant. Different causes of uncertainty, a comparison of experimental results with theoretical models, the difference between EXAFS and crystallographic thermal expansions and the meaning of the third cumulant are discussed.