Open AccessSoft X‐ray absorption spectroscopy and resonant inelastic X‐ray scattering spectroscopy below 100 eV: probing first‐row transition‐metal M ‐edges in chemical complexes
Author(s) -
Wang Hongxin,
Young Anthony T.,
Guo Jinghua,
Cramer Stephen P.,
Friedrich Stephan,
Braun Artur,
Gu Weiwei
Publication year - 2013
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049513003142
Subject(s) - x ray absorption spectroscopy , resonant inelastic x ray scattering , spectroscopy , x ray spectroscopy , absorption spectroscopy , scattering , k edge , absorption edge , synchrotron , absorption (acoustics) , chemistry , transition metal , inelastic scattering , materials science , crystallography , analytical chemistry (journal) , x ray raman scattering , physics , optics , optoelectronics , chromatography , quantum mechanics , biochemistry , catalysis , band gap , composite material
X‐ray absorption and scattering spectroscopies involving the 3 d transition‐metal K ‐ and L ‐edges have a long history in studying inorganic and bioinorganic molecules. However, there have been very few studies using the M ‐edges, which are below 100 eV. Synchrotron‐based X‐ray sources can have higher energy resolution at M ‐edges. M ‐edge X‐ray absorption spectroscopy (XAS) and resonant inelastic X‐ray scattering (RIXS) could therefore provide complementary information to K ‐ and L ‐edge spectroscopies. In this study, M 2,3 ‐edge XAS on several Co, Ni and Cu complexes are measured and their spectral information, such as chemical shifts and covalency effects, are analyzed and discussed. In addition, M 2,3 ‐edge RIXS on NiO, NiF 2 and two other covalent complexes have been performed and different d – d transition patterns have been observed. Although still preliminary, this work on 3 d metal complexes demonstrates the potential to use M ‐edge XAS and RIXS on more complicated 3 d metal complexes in the future. The potential for using high‐sensitivity and high‐resolution superconducting tunnel junction X‐ray detectors below 100 eV is also illustrated and discussed.