Open AccessInterference effects in the UV(VUV)‐excited luminescence spectroscopy of thin dielectric films
Author(s) -
Buntov Evgeny,
Zatsepin Anatoly
Publication year - 2013
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049513002835
Subject(s) - photoluminescence , luminescence , interference (communication) , materials science , dielectric , synchrotron , excited state , thin film , spectroscopy , excitation , synchrotron radiation , optoelectronics , spectral line , emission spectrum , ion , photoluminescence excitation , optics , atomic physics , chemistry , physics , computer science , nanotechnology , telecommunications , channel (broadcasting) , organic chemistry , quantum mechanics , astronomy
The problem of exciting UV and VUV light interference affecting experimental photoluminescence excitation spectra is analysed for the case of thin transparent films containing arbitrarily distributed emission centres. A numerical technique and supplied software aimed at modelling the phenomenon and correcting the distorted spectra are proposed. Successful restoration results of the experimental synchrotron data for ion‐implanted silica films show that the suggested method has high potential.