
X‐ray photon correlation spectroscopy using a fast pixel array detector with a grid mask resolution enhancer
Author(s) -
Hoshino Taiki,
Kikuchi Moriya,
Murakami Daiki,
Harada Yoshiko,
Mitamura Koji,
Ito Kiminori,
Tanaka Yoshihito,
Sasaki Sono,
Takata Masaki,
Jinnai Hiroshi,
Takahara Atsushi
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049512038769
Subject(s) - detector , pixel , optics , spectroscopy , physics , resolution (logic) , image resolution , photon counting , photon , grid , materials science , computer science , artificial intelligence , mathematics , geometry , quantum mechanics
The performance of a fast pixel array detector with a grid mask resolution enhancer has been demonstrated for X‐ray photon correlation spectroscopy (XPCS) measurements to investigate fast dynamics on a microscopic scale. A detecting system, in which each pixel of a single‐photon‐counting pixel array detector, PILATUS, is covered by grid mask apertures, was constructed for XPCS measurements of silica nanoparticles in polymer melts. The experimental results are confirmed to be consistent by comparison with other independent experiments. By applying this method, XPCS measurements can be carried out by customizing the hole size of the grid mask to suit the experimental conditions, such as beam size, detector size and sample‐to‐detector distance.