Open AccessZone‐doubled Fresnel zone plates for high‐resolution hard X‐ray full‐field transmission microscopy
Author(s) -
VilaComamala Joan,
Pan Yongsheng,
Lombardo Jeffrey J.,
Harris William M.,
Chiu Wilson K. S.,
David Christian,
Wang Yuxin
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049512029640
Subject(s) - zone plate , fresnel zone , optics , materials science , image resolution , resolution (logic) , microscopy , nanometre , physics , diffraction , computer science , artificial intelligence
Full‐field transmission X‐ray microscopy is a unique non‐destructive technique for three‐dimensional imaging of specimens at the nanometer scale. Here, the use of zone‐doubled Fresnel zone plates to achieve a spatial resolution better than 20 nm in the hard X‐ray regime (8–10 keV) is reported. By obtaining a tomographic reconstruction of a Ni/YSZ solid‐oxide fuel cell, the feasibility of performing three‐dimensional imaging of scientifically relevant samples using such high‐spatial‐resolution Fresnel zone plates is demonstrated.