Open AccessIn situ removal of carbon contamination from optics in a vacuum ultraviolet and soft X‐ray undulator beamline using oxygen activated by zeroth‐order synchrotron radiation
Author(s) -
Toyoshima Akio,
Kikuchi Takashi,
Tanaka Hirokazu,
Adachi Junichi,
Mase Kazuhiko,
Amemiya Kenta
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049512024971
Subject(s) - undulator , beamline , synchrotron radiation , optics , physics , absorption edge , absorption (acoustics) , extreme ultraviolet , k edge , carbon fibers , radiation , materials science , absorption spectroscopy , optoelectronics , laser , band gap , beam (structure) , composite number , composite material
Carbon contamination of optics is a serious issue in all soft X‐ray beamlines because it decreases the quality of experimental data, such as near‐edge X‐ray absorption fine structure, resonant photoemission and resonant soft X‐ray emission spectra in the carbon K ‐edge region. Here an in situ method involving the use of oxygen activated by zeroth‐order synchrotron radiation was used to clean the optics in a vacuum ultraviolet and soft X‐ray undulator beamline, BL‐13A at the Photon Factory in Tsukuba, Japan. The carbon contamination of the optics was removed by exposing them to oxygen at a pressure of 10 −1 –10 −4 Pa for 17–20 h and simultaneously irradiating them with zeroth‐order synchrotron radiation. After the cleaning, the decrease in the photon intensity in the carbon K ‐edge region reduced to 2–5%. The base pressure of the beamline recovered to 10 −7 –10 −8 Pa in one day without baking. The beamline can be used without additional commissioning.