Open AccessAdvantages of a synchrotron bending magnet as the sample illuminator for a wide‐field X‐ray microscope
Author(s) -
Feser M.,
Howells M. R.,
Kirz J.,
Rudati J.,
Yun W.
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049512023813
Subject(s) - microscope , beamline , synchrotron , magnet , optics , tomography , materials science , synchrotron radiation , bending , microscopy , sample (material) , physics , beam (structure) , composite material , thermodynamics , quantum mechanics
In this paper the choice between bending magnets and insertion devices as sample illuminators for a hard X‐ray full‐field microscope is investigated. An optimized bending‐magnet beamline design is presented. Its imaging speed is very competitive with the performance of similar microscopes installed currently at insertion‐device beamlines. The fact that imaging X‐ray microscopes can accept a large phase space makes them very well suited to the output characteristics of bending magnets which are often a plentiful and paid‐for resource. There exist opportunities at all synchrotron light sources to take advantage of this finding to build bending‐magnet beamlines that are dedicated to transmission X‐ray microscope facilities. It is expected that demand for such facilities will increase as three‐dimensional tomography becomes routine and advanced techniques such as mosaic tomography and XANES tomography (taking three‐dimensional tomograms at different energies to highlight elemental and chemical differences) become more widespread.