Open AccessThe LaueUtil toolkit for Laue photocrystallography. II. Spot finding and integration
Author(s) -
Kalinowski Jarosław A.,
Fournier Bertrand,
Makal Anna,
Coppens Philip
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049512022637
Subject(s) - skewness , pixel , reflection (computer programming) , computer science , intensity (physics) , frame (networking) , search engine indexing , image (mathematics) , optics , statistical analysis , distribution (mathematics) , algorithm , artificial intelligence , mathematics , physics , statistics , mathematical analysis , telecommunications , programming language
A spot‐integration method is described which does not require prior indexing of the reflections. It is based on statistical analysis of the values from each of the pixels on successive frames, followed for each frame by morphological analysis to identify clusters of high value pixels which form an appropriate mask corresponding to a reflection peak. The method does not require prior assumptions such as fitting of a profile or definition of an integration box. The results are compared with those of the seed‐skewness method which is based on minimizing the skewness of the intensity distribution within a peak's integration box. Applications in Laue photocrystallography are presented.