Open AccessImplementation of a beam deflection system for studies of liquid interfaces on beamline I07 at Diamond
Author(s) -
Arnold Thomas,
Nicklin Chris,
Rawle Jonathan,
Sutter John,
Bates Trevor,
Nutter Brian,
McIntyre Gary,
Burt Martin
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049512009272
Subject(s) - beamline , optics , grazing incidence small angle scattering , diffractometer , diffraction , specular reflection , scattering , materials science , deflection (physics) , beam (structure) , diamond , detector , physics , small angle neutron scattering , neutron scattering , scanning electron microscope , composite material
X‐ray optics, based on a double‐crystal deflection scheme, that enable reflectivity measurements from liquid surfaces/interfaces have been designed, built and commissioned on beamline I07 at Diamond Light Source. This system is able to deflect the beam onto a fixed sample position located at the centre of a five‐circle diffractometer. Thus the incident angle can be easily varied without moving the sample, and the reflected beam is tracked either by a moving Pilatus 100K detector mounted on the diffractometer arm or by a stationary Pilatus 2M detector positioned appropriately for small‐angle scattering. Thus the system can easily combine measurements of the reflectivity from liquid interfaces ( Q z > 1 Å −1 ) with off‐specular data collection, both in the form of grazing‐incidence small‐angle X‐ray scattering (GISAXS) or wider‐angle grazing‐incidence X‐ray diffraction (GIXD). The device allows operation over the energy range 10–28 keV.