Open AccessEnergy resolution of the CdTe‐XPAD detector: calibration and potential for Laue diffraction measurements on protein crystals
Author(s) -
Medjoubi Kadda,
Thompson Andrew,
Bérar JeanFrançois,
Clemens JeanClaude,
Delpierre Pierre,
Da Silva Paulo,
Dinkespiler Bernard,
Fourme Roger,
Gourhant Patrick,
Guimaraes Beatriz,
Hustache Stéphanie,
Idir Mourad,
Itié JeanPaul,
Legrand Pierre,
Menneglier Claude,
Mercere Pascal,
Picca Frederic,
Samama JeanPierre
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049512004463
Subject(s) - optics , diffraction , detector , calibration , physics , beamline , synchrotron , resolution (logic) , x ray crystallography , photon energy , beam (structure) , materials science , photon , quantum mechanics , artificial intelligence , computer science
The XPAD3S‐CdTe, a CdTe photon‐counting pixel array detector, has been used to measure the energy and the intensity of the white‐beam diffraction from a lysozyme crystal. A method was developed to calibrate the detector in terms of energy, allowing incident photon energy measurement to high resolution (approximately 140 eV), opening up new possibilities in energy‐resolved X‐ray diffraction. In order to demonstrate this, Laue diffraction experiments were performed on the bending‐magnet beamline METROLOGIE at Synchrotron SOLEIL. The X‐ray energy spectra of diffracted spots were deduced from the indexed Laue patterns collected with an imaging‐plate detector and then measured with both the XPAD3S‐CdTe and the XPAD3S‐Si, a silicon photon‐counting pixel array detector. The predicted and measured energy of selected diffraction spots are in good agreement, demonstrating the reliability of the calibration method. These results open up the way to direct unit‐cell parameter determination and the measurement of high‐quality Laue data even at low resolution. Based on the success of these measurements, potential applications in X‐ray diffraction opened up by this type of technology are discussed.