Open AccessQuantitative performance measurements of bent crystal Laue analyzers for X‐ray fluorescence spectroscopy
Author(s) -
Karanfil C.,
Bunker G.,
Newville M.,
Segre C. U.,
Chapman D.
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049512003937
Subject(s) - detector , optics , bent molecular geometry , synchrotron radiation , spectrum analyzer , materials science , spectroscopy , x ray fluorescence , crystal (programming language) , fluorescence spectroscopy , x ray absorption fine structure , synchrotron , semiconductor detector , physics , fluorescence , computer science , quantum mechanics , composite material , programming language
Third‐generation synchrotron radiation sources pose difficult challenges for energy‐dispersive detectors for XAFS because of their count rate limitations. One solution to this problem is the bent crystal Laue analyzer (BCLA), which removes most of the undesired scatter and fluorescence before it reaches the detector, effectively eliminating detector saturation due to background. In this paper experimental measurements of BCLA performance in conjunction with a 13‐element germanium detector, and a quantitative analysis of the signal‐to‐noise improvement of BCLAs are presented. The performance of BCLAs are compared with filters and slits.