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Micrometre resolution of a charge integrating microstrip detector with single photon sensitivity
Author(s) -
Schubert A.,
Bergamaschi A.,
David C.,
Dinapoli R.,
ElbrachtLeong S.,
Gorelick S.,
Graafsma H.,
Henrich B.,
Johnson I.,
Lohmann M.,
Mozzanica A.,
Radicci V.,
Rassool R.,
Schädler L.,
Schmitt B.,
Shi X.,
Sobott B.
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s090904951200235x
Subject(s) - detector , resolution (logic) , physics , image resolution , photon , sensitivity (control systems) , optics , charge (physics) , charge coupled device , microstrip , synchrotron radiation , synchrotron , chip , optoelectronics , electronic engineering , particle physics , computer science , telecommunications , artificial intelligence , engineering
A synchrotron beam has been used to test the spatial resolution of a single‐photon‐resolving integrating readout‐chip coupled to a 320 µm‐thick silicon strip sensor with a dedicated readout system. Charge interpolation methods have yielded a spatial resolution of σ x ≃ 1.8 µm for a 20 µm‐pitch strip.

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