Open AccessIn situ characterization of undulator magnetic fields
Author(s) -
Moreno Thierry,
Otero Edwige,
Ohresser Philippe
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049511052873
Subject(s) - undulator , beamline , synchrotron radiation , synchrotron , optics , physics , polarization (electrochemistry) , magnetic field , cathode ray , in situ , beam (structure) , electron , nuclear physics , chemistry , meteorology , quantum mechanics
A new in situ method is proposed to characterize the peak magnetic fields of undulator sources. The X‐ray beam emitted by the HU52 Apple‐2 undulator of the DEIMOS beamline of the SOLEIL synchrotron is analyzed using the Bragg diffraction of a Si(111) crystal. Measurements over the undulator gap range in linear horizontal polarization are compared with simulations in order to rebuild the Halbach function linking the undulator gaps to their peak magnetic fields. The method presented also allows information about the electron beam to be obtained.