Open AccessSynchrotron‐based spectroscopy of X‐ray channeling through hollow capillary microchannels inside glass plates
Author(s) -
Mazuritskiy M. I.
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049511043263
Subject(s) - synchrotron radiation , capillary action , microchannel , materials science , total internal reflection , synchrotron , monochromatic color , optics , radiation , xanes , reflection (computer programming) , microchannel plate detector , excited state , total external reflection , spectroscopy , atomic physics , optoelectronics , physics , nanotechnology , composite material , quantum mechanics , computer science , programming language , detector
Here, soft X‐ray synchrotron radiation transmitted through microchannel plates is studied experimentally. Fine structures of reflection and XANES Si L ‐edge spectra detected on the exit of silicon glass microcapillary structures under conditions of total X‐ray reflection are presented and analyzed. The phenomenon of the interaction of channeling radiation with unoccupied electronic states and propagation of X‐ray fluorescence excited in the microchannels is revealed. Investigations of the interaction of monochromatic radiation with the inner‐shell capillary surface and propagation of fluorescence radiation through hollow glass capillary waveguides contribute to the development of novel X‐ray focusing devices in the future.