Open AccessTwo‐dimensional approach to fluorescence yield XANES measurement using a silicon drift detector. Erratum
Author(s) -
Tamenori Y.,
Morita M.,
Nakamura T.
Publication year - 2011
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049511041951
Subject(s) - xanes , yield (engineering) , detector , synchrotron , synchrotron radiation , silicon , fluorescence , materials science , x ray fluorescence , optics , analytical chemistry (journal) , physics , chemistry , optoelectronics , spectroscopy , environmental chemistry , metallurgy , quantum mechanics
An error in the paper by Tamenori et al. [(2011), J. Synchrotron Rad.18, 747752] is corrected.