Open AccessX‐ray‐Raman‐scattering‐based EXAFS beyond the dipole limit
Author(s) -
Huotari Simo,
Pylkkänen Tuomas,
Soininen J. Aleksi,
Kas Joshua J.,
Hämäläinen Keijo,
Monaco Giulio
Publication year - 2012
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049511039422
Subject(s) - extended x ray absorption fine structure , surface extended x ray absorption fine structure , scattering , absorption (acoustics) , raman scattering , chemistry , materials science , raman spectroscopy , optics , absorption spectroscopy , physics
X‐ray Raman scattering (XRS) provides a bulk‐sensitive method of measuring the extended X‐ray absorption fine structure (EXAFS) of soft X‐ray absorption edges. Accurate measurements and data analysis procedures for the determination of XRS‐EXAFS of polycrystalline diamond are described. The contributions of various angular‐momentum components beyond the dipole limit to the atomic background and the EXAFS oscillations are incorporated using self‐consistent real‐space multiple‐scattering calculations. The properly extracted XRS‐EXAFS oscillations are in good agreement with calculations and earlier soft X‐ray EXAFS results. It is shown, however, that under certain conditions multiple‐scattering contributions to XRS‐EXAFS deviate from those in standard EXAFS, leading to noticeable changes in the real‐space signal at higher momentum transfers owing to non‐dipole contributions. These results pave the way for the accurate application of XRS‐EXAFS to previously inaccessible light‐element systems.