Open AccessDevelopment of a soft X‐ray angle‐resolved photoemission system applicable to 100 µm crystals
Author(s) -
Muro Takayuki,
Kato Yukako,
Matsushita Tomohiro,
Kinoshita Toyohiko,
Watanabe Yoshio,
Okazaki Hiroyuki,
Yokoya Takayoshi,
Sekiyama Akira,
Suga Shigemasa
Publication year - 2011
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049511034418
Subject(s) - angle resolved photoemission spectroscopy , synchrotron radiation , crystal (programming language) , photoemission spectroscopy , materials science , single crystal , synchrotron , excitation , optics , photon energy , intensity (physics) , photon , x ray photoelectron spectroscopy , atomic physics , physics , crystallography , chemistry , nuclear magnetic resonance , electronic structure , condensed matter physics , quantum mechanics , computer science , programming language
A system for angle‐resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X‐ray synchrotron radiation with a spot size of ∼40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ– X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.