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In situ two‐dimensional imaging quick‐scanning XAFS with pixel array detector
Author(s) -
Tanida Hajime,
Yamashige Hisao,
Orikasa Yuki,
Oishi Masatsugu,
Takanashi Yu,
Fujimoto Takahiro,
Sato Kenji,
Takamatsu Daiko,
Murayama Haruno,
Arai Hajime,
Matsubara Eiichiro,
Uchimoto Yoshiharu,
Ogumi Zempachi
Publication year - 2011
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049511031232
Subject(s) - x ray absorption fine structure , optics , detector , pixel , image resolution , materials science , resolution (logic) , energy (signal processing) , physics , noise (video) , dynamic range , spectroscopy , image (mathematics) , computer science , quantum mechanics , artificial intelligence
Quick‐scanning X‐ray absorption fine structure (XAFS) measurements were performed in transmission mode using a PILATUS 100K pixel array detector (PAD). The method can display a two‐dimensional image for a large area of the order of a centimetre with a spatial resolution of 0.2 mm at each energy point in the XAFS spectrum. The time resolution of the quick‐scanning method ranged from 10 s to 1 min per spectrum depending on the energy range. The PAD has a wide dynamic range and low noise, so the obtained spectra have a good signal‐to‐noise ratio.

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