Open AccessRevealing low‐dose radiation damage using single‐crystal spectroscopy
Author(s) -
Owen Robin L.,
Yorke Briony A.,
Gowdy James A.,
Pearson Arwen R.
Publication year - 2011
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049511004250
Subject(s) - radiation damage , radiation , spectroscopy , single crystal , materials science , absorption (acoustics) , absorption spectroscopy , crystallography , radiochemistry , chemistry , optics , physics , quantum mechanics , composite material
The structural information and functional insight obtained from X‐ray crystallography can be enhanced by the use of complementary spectroscopies. Here the information that can be obtained from spectroscopic methods commonly used in conjunction with X‐ray crystallography and best‐practice single‐crystal UV‐Vis absorption data collection are briefly reviewed. Using data collected with the in situ system at the Swiss Light Source, the time and dose scales of low‐dose X‐ray‐induced radiation damage and solvated electron generation in metalloproteins at 100 K are investigated. The effect of dose rate on these scales is also discussed.