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New developments in fabrication of high‐energy‐resolution analyzers for inelastic X‐ray spectroscopy
Author(s) -
Said Ayman H.,
Sinn Harald,
Divan Ralu
Publication year - 2011
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049511001828
Subject(s) - spectroscopy , bent molecular geometry , fabrication , resolution (logic) , radius of curvature , inelastic scattering , materials science , spectrum analyzer , bending , focus (optics) , curvature , optics , radius , scattering , physics , computer science , medicine , mean curvature , alternative medicine , geometry , mathematics , pathology , quantum mechanics , mean curvature flow , artificial intelligence , composite material , computer security
In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy‐resolution inelastic X‐ray scattering spectroscopy are presented. The new method includes the use of a two‐dimensional bender to achieve the required radius of curvature for X‐ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher‐efficiency analyzers.

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