Open AccessFeasibility of in‐line instruments for high‐resolution inelastic X‐ray scattering
Author(s) -
Sturhahn W.,
Toellner T. S.
Publication year - 2011
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049510053513
Subject(s) - collimated light , line (geometry) , synchrotron radiation , scattering , optics , resolution (logic) , inelastic scattering , x ray , physics , synchrotron , resonant inelastic x ray scattering , spectroscopy , beamline , computer science , x ray raman scattering , laser , mathematics , beam (structure) , geometry , quantum mechanics , artificial intelligence
Inelastic X‐ray scattering instruments in operation at third‐generation synchrotron radiation facilities are based on backreflections from perfect silicon crystals. This concept reaches back to the very beginnings of high‐energy‐resolution X‐ray spectroscopy and has several advantages but also some inherent drawbacks. In this paper an alternate path is investigated using a different concept, the `M 4 instrument'. It consists of a combination of two in‐line high‐resolution monochromators, focusing mirrors and collimating mirrors. Design choices and performance estimates in comparison with existing conventional inelastic X‐ray scattering instruments are presented.