Open AccessAdaption of a diffractometer for time‐resolved X‐ray resonant magnetic scattering
Author(s) -
Buschhorn Stefan,
Brüssing Frank,
Abrudan Radu,
Zabel Hartmut
Publication year - 2011
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049510045358
Subject(s) - scattering , diffractometer , magnetization , optics , synchrotron , magnetization dynamics , physics , materials science , reflection (computer programming) , magnetic field , atomic physics , nuclear magnetic resonance , scanning electron microscope , quantum mechanics , computer science , programming language
A new set‐up is presented to measure element‐selective magnetization dynamics using the ALICE chamber [Grabis et al. (2003), Rev. Sci. Instrum. 74 , 4048–4051] at the BESSY II synchrotron at the Helmholtz‐Zentrum Berlin. A magnetic‐field pulse serves as excitation, and the magnetization precession is probed by element‐selective X‐ray resonant magnetic scattering. With the use of single‐bunch‐generated X‐rays a temporal resolution well below 100 ps is reached. The ALICE diffractometer environment enables investigations of thin films, described here, multilayers and laterally structured samples in reflection or diffuse scattering geometry. The combination of the time‐resolved set‐up with a cryostat in the ALICE chamber will allow temperature‐dependent studies of precessional magnetization dynamics and of damping constants to be conducted over a large temperature range and for a large variety of systems in reflection geometry.