Open AccessAngle‐resolved photoemission spectroscopy and imaging with a submicrometre probe at the SPECTROMICROSCOPY‐3.2L beamline of Elettra
Author(s) -
Dudin Pavel,
Lacovig Paolo,
Fava Claudio,
Nicolini Eugenio,
Bianco Anna,
Cautero Giuseppe,
Barinov Alexei
Publication year - 2010
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049510013993
Subject(s) - beamline , synchrotron , optics , photoemission spectroscopy , spectroscopy , materials science , synchrotron radiation , x ray photoelectron spectroscopy , microscopy , analytical chemistry (journal) , physics , chemistry , nuclear magnetic resonance , beam (structure) , quantum mechanics , chromatography
The extensive upgrade of the experimental end‐station of the SPECTROMICROSCOPY‐3.2L beamline at Elettra synchrotron light source is reported. After the upgrade, angle‐resolved photoemission spectroscopy from a submicrometre spot and scanning microscopy images monitoring the photoelectron signal inside selected acquisition angle and energy windows can be performed. As a test case, angle‐resolved photoemission spectroscopy from single flakes of highly oriented pyrolitic graphite and imaging of the flakes with image contrast owing to rotation of the band dispersion of different flakes are presented.