Open AccessWavelength‐dispersive spectrometer for X‐ray microfluorescence analysis at the X‐ray microscopy beamline ID21 (ESRF)
Author(s) -
Szlachetko J.,
Cotte M.,
Morse J.,
Salomé M.,
Jagodzinski P.,
Dousse J.Cl.,
Hoszowska J.,
Kayser Y.,
Susini J.
Publication year - 2010
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049510010691
Subject(s) - beamline , spectrometer , optics , synchrotron radiation , synchrotron , materials science , resolution (logic) , x ray , microscopy , physics , beam (structure) , artificial intelligence , computer science
The development of a wavelength‐dispersive spectrometer for microfluorescence analysis at the X‐ray Microscopy ID21 beamline of the European Synchrotron Radiation Facility (ESRF) is reported. The spectrometer is based on a polycapillary optic for X‐ray fluorescence collection and is operated in a flat‐crystal geometry. The design considerations as well as operation characteristics of the spectrometer are presented. The achieved performances, in particular the energy resolution, are compared with the results of Monte Carlo simulations. Further improvement in the energy resolution, down to ∼eV range, by employing a double‐crystal geometry is examined. Finally, examples of applications requiring both spatial and spectral resolutions are presented.