Open AccessCoherence and wavefront characterization of Si‐111 monochromators using double‐grating interferometry
Author(s) -
Diaz Ana,
Mocuta Cristian,
Stangl Julian,
Keplinger Mario,
Weitkamp Timm,
Pfeiffer Franz,
David Christian,
Metzger Till H.,
Bauer Günther
Publication year - 2010
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049510004644
Subject(s) - monochromator , optics , wavefront , coherence (philosophical gambling strategy) , interferometry , physics , grating , x ray optics , diffraction , coherence time , x ray , laser , wavelength , quantum mechanics
A study of the coherence and wavefront properties of a pseudo‐channel‐cut monochromator in comparison with a double‐crystal monochromator is presented. Using a double‐grating interferometer designed for the hard X‐ray regime, the complex coherence factor was measured and the wavefront distortions at the sample position were analyzed. A transverse coherence length was found in the vertical direction that was a factor of two larger for the channel‐cut monochromator owing to its higher mechanical stability. The wavefront distortions after different optical elements in the beam, such as monochromators and mirrors, were also quantified. This work is particularly relevant for coherent diffraction imaging experiments with synchrotron sources.