Open AccessOne‐dimensional small‐angle X‐ray scattering tomography of dip‐coated polyamide 6 monofilaments
Author(s) -
Kraft P.,
Bunk O.,
Reifler F. A.,
Hufenus R.,
Heuberger M.,
Pfeiffer F.
Publication year - 2010
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049509054156
Subject(s) - small angle x ray scattering , scattering , materials science , polyamide , synchrotron , radius , optics , synchrotron radiation , protein filament , nanostructure , dip coating , x ray , coating , physics , composite material , nanotechnology , computer security , computer science
A synchrotron study is presented in which the concept of one‐dimensional tomographic reconstruction of small‐angle X‐ray scattering patterns is applied to investigate polyamide 6 monofilaments, dip‐coated with alumina particles. The filaments are scanned with a focused synchrotron beam and the resulting scattering patterns are recorded with a PILATUS 2M detector. The reconstructed sequence of SAXS images reflects the local nanostructure variation along the filament radius. In particular, the influence of coating process parameters on the polyamide 6 is investigated.