One‐dimensional small‐angle X‐ray scattering tomography of dip‐coated polyamide 6 monofilaments | Zendy

Kraft P. | Zendy; Bunk O. | Zendy; Reifler F. A. | Zendy; Hufenus R. | Zendy; Heuberger M. | Zendy; Pfeiffer F. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

One‐dimensional small‐angle X‐ray scattering tomography of dip‐coated polyamide 6 monofilaments

Author(s) -

Kraft P.,

Bunk O.,

Reifler F. A.,

Hufenus R.,

Heuberger M.,

Pfeiffer F.

Publication year - 2010

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049509054156

Subject(s) - small angle x ray scattering , scattering , materials science , polyamide , synchrotron , radius , optics , synchrotron radiation , protein filament , nanostructure , dip coating , x ray , coating , physics , composite material , nanotechnology , computer security , computer science

A synchrotron study is presented in which the concept of one‐dimensional tomographic reconstruction of small‐angle X‐ray scattering patterns is applied to investigate polyamide 6 monofilaments, dip‐coated with alumina particles. The filaments are scanned with a focused synchrotron beam and the resulting scattering patterns are recorded with a PILATUS 2M detector. The reconstructed sequence of SAXS images reflects the local nanostructure variation along the filament radius. In particular, the influence of coating process parameters on the polyamide 6 is investigated.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research