Open AccessConcept of a spectrometer for resonant inelastic X‐ray scattering with parallel detection in incoming and outgoing photon energies
Author(s) -
Strocov V. N.
Publication year - 2010
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049509051097
Subject(s) - spectrometer , undulator , physics , optics , beamline , resonant inelastic x ray scattering , scattering , photon , laser , inelastic scattering , atomic physics , inelastic neutron scattering , beam (structure)
A spectrometer for resonant inelastic X‐ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver a full two‐dimensional map of RIXS intensity in one shot with parallel detection at incoming hv in and outgoing hv out photon energies. Preliminary ray‐tracing simulations with a typical undulator beamline demonstrate a resolving power well above 11000 with both hv in and hv out near 930 eV, with a vast potential for improvement. Combining this instrument – nicknamed hv 2 spectrometer – with an X‐ray free‐electron laser source simplifies its technical implementation and enables efficient time‐resolved RIXS experiments.